electromigration

电迁移
  • 文章类型: Journal Article
    通过采矿对加纳的汞(Hg)污染已成为严重的环境挑战。这项研究调查了Cirsiumarvense使用电动电流在加纳南部采矿活动严重污染的金矿尾矿中有或没有碘化物溶液的情况下对Hg进行光稳定的潜力。使用冷蒸气原子吸收光谱法(CVAAS)测定的初始Hg浓度为9.60mg/kg。生物吸收系数,生物富集因子,并提出了汞的易位因子。因此,Cirsiumarvense具有较高的生物富集因子(BCF),为2.6-5.15mg/kg,转移因子(TF)为0.24-0.36,表明植物稳定效率更高。在电流和碘化物联合处理中,Cirsiumarvense从尾矿中提取汞的速率和时间均得到了有效改善。植物和电流联合处理以及植物和碘化物联合处理的植物稳定率仅为60%和50%,分别。合并后的工厂,碘化物,事实证明,电流处理优于汞去除率约90%。因此,合并后的工厂,碘化物,由于较高的溶解速率和对Hg物种的电迁移作用,电流处理在较短的时间内通过Cirsiumarvense实现了更高的Hg去除效率。
    Mercury (Hg) pollution in Ghana through mining has become a serious environmental challenge. This study investigates the potential of Cirsium arvense to photostabilize Hg using electrokinetic current with or without an iodide solution in gold mine tailings heavily contaminated through mining activities in southern Ghana. An initial Hg concentration of 9.60 mg/kg using cold vapor atomic absorption spectrometry (CVAAS) was determined. The biological absorption coefficient, bioconcentration factor, and translocation factor of Hg have been presented. Cirsium arvense therefore had a higher bioconcentration factor (BCF) of 2.6-5.15 mg/kg, and a transfer factor (TF) of 0.24-0.36 indicating a higher efficiency for phytostabilization. Both the rate and time of extractions of Hg from the tailings by Cirsium arvense are efficiently improved in the combined electric current and iodide treatment. Plant and electric current combined treatment and plant and iodide combined treatment had only 60 and 50% phytostabilization rates, respectively. The combined plant, iodide, and electric current treatment has proven to be superior with about >90% Hg removal rate. Therefore, the combined plant, iodide, and electric current treatment resulted in a higher Hg removal efficiency by Cirsium arvense in a shorter period due to higher solubilization rate and electromigration effects on Hg species.
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  • 文章类型: Journal Article
    为了减轻电迁移引起的损伤导致的Sn58Bi/Cu焊点的机械性能降低。通过熔铸方法将CeO2纳米颗粒掺入Sn58Bi焊料中,研究了电迁移条件下Sn58Bi/Cu焊点组织和性能的影响。研究结果表明,添加0.125〜0.5wt%的CeO2纳米粒子细化Sn58Bi焊料合金的共晶组织。添加量为0.5wt%时,复合焊料合金的最大抗拉强度为68.9MPa,比基础焊料高37%。CeO2纳米粒子增强的Sn58Bi焊料可以实现与Cu衬底的优异可焊性,并且接头可以显着抑制阳极富Bi层的生长,负责电迁移。随着电流压力时间的延长,富Bi和富Sn层分别形成在接头中的阳极和阴极上。金属间化合物(IMC)层不对称生长,从扇形形态过渡到阳极处的扁平结构,并在阴极处过渡到增厚的山状形态。添加CeO2纳米颗粒有助于在一定程度上减轻电流施加期间由电迁移损伤引起的机械性能的降低。在当前288~480h的应力期间,断裂位置从阳极IMC/Bi富集界面向阴极Sn富集界面移动。断裂机制从以板状解理为特征的脆性断裂转变为具有细窝和解理的韧性-脆性混合断裂。
    To mitigate the decrease in mechanical performance of Sn58Bi/Cu solder joints resulting from electromigration-induced damage. The CeO2 nanoparticles were incorporated into Sn58Bi solder by a melt-casting method, and their effects on the microstructure and properties of Sn58Bi/Cu solder joints under electromigration were investigated. The study results demonstrate that the addition of 0.125 ~ 0.5 wt% CeO2 nanoparticles refines the eutectic microstructure of Sn58Bi solder alloy. At an addition amount of 0.5 wt%, the composite solder alloy exhibits the maximum tensile strength of 68.9 MPa, which is 37% higher than that of the base solder. CeO2 nanoparticle-reinforced Sn58Bi solder can achieve excellent solderbility with Cu substrates and the joints can significantly inhibit the growth of the anodic Bi-rich layer, which is responsible for electromigration. With the extension of current stressing time, Bi-rich and Sn-rich layer are respectively formed on the anode and cathode in the joints. The intermetallic compound (IMC) layer grows asymmetrically, transitioning from a fan-shaped morphology to a flattened structure at the anode and to a thickened mountain-like morphology at the cathode. Adding the CeO2 nanoparticles helps to mitigate the decrease in mechanical performance caused by electromigration damage during current application to some extent. Over the current stressing period of 288 ~ 480 h, the fracture position shifts from the anodic IMC/Bi-rich interface to the cathodic Sn-rich/IMC interface. The fracture mechanism transitions from a brittle fracture characterized by plate-like cleavage to a ductile-brittle mixed fracture with fine dimples and cleavage.
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  • 文章类型: Journal Article
    已建议将隧道结用作液体中的高通量电子单分子传感器,并使用具有可重构间隙的断裂结进行了一些开创性实验。对于实际的单分子传感应用,芯片上集成固定间隙隧道结的阵列,可以内置到紧凑的系统是优选的。通过电迁移制造纳米间隙是实现片上集成隧道结传感器的最有前途的方法之一。然而,迄今为止,尚未系统地研究浸入液体介质中的固定间隙隧道结的电气行为,在液体介质中电迁移纳米间隙隧道结的形成尚未得到证实。在这项工作中,我们对通过浸入各种液体和气体介质(去离子水,均三甲苯,乙醇,氮,和空气)。我们证明了隧道结可以从液体介质内部的微加工金纳米收缩中获得。结在空气中的电迁移产生最高的产量(61-67%),在去离子水和均三甲苯中的电迁移导致产率低于在空气中(44-48%),而乙醇中的电迁移由于干扰电化学过程而无法产生可行的隧道结。我们绘制出所得隧道结的电导特性的稳定性,并确定对形成稳定结的产量有影响的特定于介质的操作条件。此外,我们强调了与批量处理大量隧道结阵列相关的独特挑战。我们的发现将为未来使用片上集成隧道结构建单分子传感器的努力提供信息。
    Tunnel junctions have been suggested as high-throughput electronic single molecule sensors in liquids with several seminal experiments conducted using break junctions with reconfigurable gaps. For practical single molecule sensing applications, arrays of on-chip integrated fixed-gap tunnel junctions that can be built into compact systems are preferable. Fabricating nanogaps by electromigration is one of the most promising approaches to realize on-chip integrated tunnel junction sensors. However, the electrical behavior of fixed-gap tunnel junctions immersed in liquid media has not been systematically studied to date, and the formation of electromigrated nanogap tunnel junctions in liquid media has not yet been demonstrated. In this work, we perform a comparative study of the formation and electrical behavior of arrays of gold nanogap tunnel junctions made by feedback-controlled electromigration immersed in various liquid and gaseous media (deionized water, mesitylene, ethanol, nitrogen, and air). We demonstrate that tunnel junctions can be obtained from microfabricated gold nanoconstrictions inside liquid media. Electromigration of junctions in air produces the highest yield (61-67%), electromigration in deionized water and mesitylene results in a lower yield than in air (44-48%), whereas electromigration in ethanol fails to produce viable tunnel junctions due to interfering electrochemical processes. We map out the stability of the conductance characteristics of the resulting tunnel junctions and identify medium-specific operational conditions that have an impact on the yield of forming stable junctions. Furthermore, we highlight the unique challenges associated with working with arrays of large numbers of tunnel junctions in batches. Our findings will inform future efforts to build single molecule sensors using on-chip integrated tunnel junctions.
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  • 文章类型: Journal Article
    由于集成电路领域的持续小型化和高载流需求,以及节省空间和提高计算能力的愿望,有一个不断的驱动,以减少集成电路的大小。然而,高度集成的电路也带来了诸如高电流密度和过度焦耳加热等挑战,导致了一系列由电迁移引起的可靠性问题。因此,集成电路的服务可靠性一直是人们关注的问题。锡基焊料由于其可用性而在行业中得到广泛认可,操作期间的最小技术问题,与传统焊料的兼容性好。然而,主要是基于锡的焊料,如SAC305和SnZn,具有复杂的电子电路高熔点。当添加Bi时,焊料的熔点降低,但也可能导致与电迁移可靠性相关的问题。本文回顾了电流在Cu衬底上SnBi焊点中的电迁移的一般原理,以及晶须形成的现象,空隙/裂缝,相分离,以及由于电迁移引起的原子迁移引起的电阻增加。此外,它探索了通过包括Fe在内的添加剂来提高焊点可靠性的方法,Ni,Ag,Zn,Co,RA(稀土元素),GNS(石墨烯纳米片),FNS(富勒烯)和Al2O3。此外,改变焊点内的晶体取向或向焊点引入应力也可以在不改变成分条件的情况下在一定程度上提高其可靠性。在文献中还对相应的可靠性增强机制进行了比较和讨论。
    Due to the continuous miniaturization and high current-carrying demands in the field of integrated circuits, as well as the desire to save space and improve computational capabilities, there is a constant drive to reduce the size of integrated circuits. However, highly integrated circuits also bring about challenges such as high current density and excessive Joule heating, leading to a series of reliability issues caused by electromigration. Therefore, the service reliability of integrated circuits has always been a concern. Sn-based solders are widely recognized in the industry due to their availability, minimal technical issues during operation, and good compatibility with traditional solders. However, solders that are mostly Sn-based, such as SAC305 and SnZn, have a high melting point for sophisticated electronic circuits. When Bi is added, the melting point of the solder decreases but may also lead to problems related to electromigration reliability. This article reviews the general principles of electromigration in SnBi solder joints on Cu substrates with current flow, as well as the phenomena of whisker formation, voids/cracks, phase separation, and resistance increase caused by atomic migration due to electromigration. Furthermore, it explores methods to enhance the reliability of solder joint by additives including Fe, Ni, Ag, Zn, Co, RA (rare earth element), GNSs (graphene nanosheets), FNS (Fullerene) and Al2O3. Additionally, modifying the crystal orientation within the solder joint or introducing stress to the joint can also improve its reliability to some extent without changing the composition conditions. The corresponding mechanisms of reliability enhancement are also compared and discussed among the literature.
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  • 文章类型: Journal Article
    由于环境中的PFAS和相关的健康风险,人们对解决被全氟烷基和多氟烷基物质(PFAS)污染的土壤非常感兴趣。PFAS的原位中和是具有挑战性的。因此,已进行了将PFAS从受污染的土壤中动员到水溶液中以进行后续处理。尽管如此,去除PFAS的动员方法的效率可以根据特定地点的因素而变化,包括PFAS化合物的类型和浓度,土壤特性。在本研究中,在2D实验室设置中,使用电动(EK)修复和水力冲洗,通过施加水力梯度(HG)持续15天,对人工污染土壤中全氟辛酸(PFOA)和全氟辛烷磺酸(PFOS)的去除进行了研究。在对所有土壤进行15天处理后,EK对PFOA的去除百分比是一致的(~80%)。EK对全氟辛烷磺酸的去除效率随OM含量的变化而显著变化,其中全氟辛烷磺酸的去除率从5%OM的14%增加到50%OM的60%。有了HG,PFOA和PFOS的去除百分比从5%OM时的约20%增加到75%OM时的80%。根据结果,考虑到针对特定地点的因素和要求,水力冲洗和EK的适用性和彼此之间的优势,从有机土壤中动员PFAS是合适的。
    There is considerable interest in addressing soils contaminated with per- and polyfluoroalkyl substances (PFAS) because of the PFAS in the environment and associated health risks. The neutralization of PFAS in situ is challenging. Consequently, mobilizing the PFAS from the contaminated soils into an aqueous solution for subsequent handling has been pursued. Nonetheless, the efficiency of mobilization methods for removing PFAS can vary depending on site-specific factors, including the types and concentrations of PFAS compounds, soil characteristics. In the present study, the removal of perfluorooctanoate (PFOA) and perfluorooctane sulfonate (PFOS) from artificially contaminated soils was investigated in a 2D laboratory setup using electrokinetic (EK) remediation and hydraulic flushing by applying a hydraulic gradient (HG) for a duration of 15 days. The percent removal of PFOA by EK was consistent (∼80%) after a 15-day treatment for all soils. The removal efficiency of PFOS by EK significantly varied with the OM content, where the PFOS removal increased from 14% at 5% OM to 60% at 50% OM. With HG, the percent removal increased for both PFOA and PFOS from about 20% at 5% OM up to 80% at 75% OM. Based on the results, the mobilization of PFAS from organic soil would be appropriate using both hydraulic flushing and EK considering their applicability and advantages over each other for site-specific factors and requirements.
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  • 文章类型: Journal Article
    这项工作描述了一种新颖的分析方法,使用毛细管电泳(CE)与电容耦合非接触电导检测(C4D)同时,简单,和快速测定三种无机磷酸盐(正磷酸盐,焦磷酸盐,和三聚磷酸盐)广泛用作食品添加剂和药物制剂。由0.5molL-1乙酸组成的背景电解质提供快速分离(约3.0分钟)和良好的分离效率和峰分辨率。测定系数(R2)高于0.99,证实了10-500mgL-1浓度范围内的线性。检测限从0.41到0.58mgL-1不等。所提出的方法的准确性是通过在自来水样品中的三个浓度水平进行的回收率测试来评估的,食物,和个人卫生产品。达到了81%至118%的回收率,表明可接受的准确性。所提出的CE-C4D成功地测定了所分析样品中的三种无机磷酸盐。
    This work describes a novel analytical method using capillary electrophoresis (CE) with capacitively coupled contactless conductivity detection (C4D) for simultaneous, simple, and rapid determination of three inorganic phosphates (orthophosphate, pyrophosphate, and tripolyphosphate) widely used as food additives and in pharmaceutical formulations. A background electrolyte composed of 0.5 mol L-1 acetic acid provided fast separation (around 3.0 min) and good separation efficiency and peak resolution. Linearity in the concentration range of 10-500 mg L-1 was confirmed by the coefficients of determination (R2) higher than 0.99. The limits of detection varied from 0.41 to 0.58 mg L-1. The accuracy of the proposed method was assessed by recovery tests conducted at three concentration levels in tap water samples, food, and personal hygiene products. Recovery values varying from 81% to 118% were achieved, indicating an acceptable accuracy. The proposed CE-C4D successfully determined the three inorganic phosphates in the analyzed samples.
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  • 文章类型: Journal Article
    活性炭吸附是降低水性全氟辛酸(PFOA)环境风险的常用方法,同时需要有效和灵活的PFOA吸附方法。在存在外部DC电场的情况下,温度的变化或电动现象(电渗和电迁移)的使用已经显示出改变污染物的污染物吸附。它们在PFOA吸附中的作用,然而,尚不清楚。这里,研究了直流电场和温度对活性炭吸附PFOA的共同影响。在存在和不存在DC场的情况下,进行了温度依赖性分批和柱吸附实验,并使用不同的动力学吸附模型对结果进行了评估。我们发现DC和温度对PFOA吸附的相互作用,这是通过电解质的液体粘度(η)连接。例如,与无DC对照相比,DC场和低温的共同存在使PFOA负荷在48小时内增加了38%。我们进一步开发了一个模型,该模型使我们能够预测PFOA吸附动力学驱动器上与温度和DC场强相关的电动益处(即,颗粒内扩散系数和薄膜传质系数)。我们的见解可能会引发未来DC和温度驱动的PFOA吸附应用,例如,响应受污染水流中PFOA浓度的波动。
    Sorption to activated carbon is a common approach to reducing environmental risks of waterborne perfluorooctanoic acid (PFOA), while effective and flexible approaches to PFOA sorption are needed. Variations in temperature or the use of electrokinetic phenomena (electroosmosis and electromigration) in the presence of external DC electric fields have been shown to alter the contaminant sorption of contaminants. Their role in PFOA sorption, however, remains unclear. Here, we investigated the joint effects of DC electric fields and the temperature on the sorption of PFOA on activated carbon. Temperature-dependent batch and column sorption experiments were performed in the presence and absence of DC fields, and the results were evaluated by using different kinetic sorption models. We found an emerging interplay of DC and temperature on PFOA sorption, which was linked via the liquid viscosity (η) of the electrolyte. For instance, the combined presence of a DC field and low temperature increased the PFOA loading up to 38% in 48 h relative to DC-free controls. We further developed a model that allowed us to predict temperature- and DC field strength-dependent electrokinetic benefits on the drivers of PFOA sorption kinetics (i.e., intraparticle diffusivity and the film mass transfer coefficient). Our insights may give rise to future DC- and temperature-driven applications for PFOA sorption, for instance, in response to fluctuating PFOA concentrations in contaminated water streams.
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  • 文章类型: Journal Article
    已使用热线化学气相沉积验证了石墨烯全方位(GAA)结构在380°C下直接生长,在线路后端(BEOL)的热预算内。具有GAA结构的钴(Co)互连显示电流密度增加了10.8%,电阻降低27%,和36倍更长的电迁移寿命。X射线光电子能谱和密度泛函理论计算揭示了碳和Co之间存在键合,这使得Co原子更稳定以抵抗外力。石墨烯在GAA结构中充当扩散阻挡层的能力通过时间依赖性电介质击穿测量得到证实。GAA结构内的Co互连表现出增强的电性能和可靠性,这表明在CMOSBEOL中作为下一代互连材料的兼容性应用。
    The graphene-all-around (GAA) structure has been verified to grow directly at 380 °C using hot-wire chemical vapor deposition, within the thermal budget of the back end of the line (BEOL). The cobalt (Co) interconnects with the GAA structure have demonstrated a 10.8% increase in current density, a 27% reduction in resistance, and a 36 times longer electromigration lifetime. X-ray photoelectron spectroscopy and density functional theory calculations have revealed the presence of bonding between carbon and Co, which makes the Co atom more stable to resist external forces. The ability of graphene to act as a diffusion barrier in the GAA structure was confirmed through time-dependent dielectric breakdown measurement. The Co interconnect within the GAA structure exhibits enhanced electrical properties and reliability, which indicates compatibility applications as next-generation interconnect materials in CMOS BEOL.
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  • 文章类型: Journal Article
    2,4-二氯苯酚(2,4-DCP)由于其稳定的化学性质,在环境中难以快速降解,因此容易导致土壤中严重的氯酚污染。因此,一种有效的补救方法,安全,和经济是必需的。在这项研究中,电动(EK)修复用于将过硫酸钠(Na2S2O8)转移到土壤中以降解2,4-DCP,以及几个因素的影响(包括Na2S2O8的添加位置、施加电压、和运行时间)对修复效率进行了探索。Na2S2O8的浓度、2,4-DCP的残留效率和pH的分布特征,和电导率进行了分析。结果表明,阴极是添加Na2S2O8的最佳位置。在这种情况下,Na2S2O8通过电迁移在整个土壤柱中均匀分布。当电压梯度为1.0V/cm,操作时间为9天时,添加Na2S2O8对土壤中2,4-DCP的最佳去除效率约为26%。这主要是由于S2O82-的降解。
    2,4-Dichlorophenol (2,4-DCP) is difficult to degrade rapidly in the environment due to its stable chemical properties, so it was easy to lead to serious chlorophenol pollution in soil. Consequently, a remediation method which is efficient, safe, and economical is required. In this study, electrokinetic (EK) remediation was used to transfer sodium persulfate (Na2S2O8) into soil to degrade 2,4-DCP, and the effect of several factors (including the addition location of Na2S2O8, applied voltage, and running time) on the remediation efficiency was explored. The concentration of Na2S2O8, residual efficiency of 2,4-DCP and distribution characteristics of pH, and electrical conductivity were analyzed. The results showed that the cathode was the optimal position to add Na2S2O8. Under this condition, Na2S2O8 was uniformly distributed in the whole soil column through electromigration. The optimal removal efficiency of 2,4-DCP in soil by adding Na2S2O8 was approximately 26% when the voltage gradient was 1.0 V/cm and the operating time was 9 days, which was mainly due to the degradation of S2O82-.
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  • 文章类型: Journal Article
    在150°C的电迁移过程中,在Cu-Cu接头中检查了再结晶和晶粒生长的行为。在电迁移9000小时后,在所有接头中观察到再结晶和晶粒生长。在Cu电流馈送线和键合界面中形成空隙,并且由于空隙的形成,电阻随时间增加。然而,而不是突然崛起,某些Cu接头的电阻在7000小时后下降。显微组织分析表明,在150°C时,这些接头中发生了大的晶粒生长,并消除了键合界面。因此,这些接头的电迁移寿命可以延长。
    The behavior of recrystallization and grain growth was examined in Cu-Cu joints during electromigration at 150 °C. Recrystallization and grain growth were observed in all the joints after electromigration for 9000 h. Voiding was formed in Cu current-feeding lines and in bonding interfaces, and resistance increased with time due to the void formation. However, instead of rising abruptly, the resistance of certain Cu joints dropped after 7000 h. Microstructural analysis revealed that a large grain growth occurred in these joints at 150 °C, and the bonding interface was eliminated. Therefore, the electromigration lifetime can be prolonged for these joints.
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