Abstract：
Although defocus can be used to generate partial phase contrast in transmission electron microscope images, cryo-electron microscopy (cryo-EM) can be further improved by the development of phase plates which increase contrast by applying a phase shift to the unscattered part of the electron beam. Many approaches have been investigated, including the ponderomotive interaction between light and electrons. We review the recent successes achieved with this method in high-resolution, single-particle cryo-EM. We also review the status of using pulsed or near-field enhanced laser light as alternatives, along with approaches that use scanning transmission electron microscopy (STEM) with a segmented detector rather than a phase plate.
摘要：
尽管散焦可用于在透射电子显微镜图像中产生部分相衬，通过开发相位板可以进一步改善低温电子显微镜（cryo-EM），该相位板通过对电子束的未散射部分施加相移来增加对比度。已经研究了许多方法，包括光和电子之间的能动相互作用。我们回顾了这种方法在高分辨率方面取得的最新成功，单粒子低温EM。我们还回顾了使用脉冲或近场增强激光作为替代品的现状，以及使用具有分段检测器而不是相位板的扫描透射电子显微镜（STEM）的方法。
