%0 Journal Article
%T Lorentz Scanning Electron/Ion Microscopy.
%A Harada K
%A Shimada K
%A Takahashi Y
%J Microscopy (Oxf)
%V 0
%N 0
%D Dec 2021 3
%M 34865090
%F 2.072
%R 10.1093/jmicro/dfab054
%X We have developed an observation and measurement method for spatial electromagnetic fields by using scanning electron/ion microscopes, combined with electron holography reconstruction technique. A cross-grating was installed below the specimen, and the specimens were observed under the infocus condition, and the grating was simultaneously observed under the defocus condition. Electromagnetic fields around the specimen were estimated from grating-image distortions. This method is effective for low and middle magnification and resolution ranges; furthermore, this method can in principle be realizable in any electron/ion beam instruments because it is based on the Lorentz force model for charged particle beams. Mini Abstract We have developed a visualization technique for spatial electromagnetic fields by using scanning electron/ion microscopes, combined with electron holography reconstruction technique. A specimen and a cross-grating installed below the specimen were observed simultaneously. The distorted grating image caused by electromagnetic fields around the specimen were quantitatively measured and visualized.