Abstract：
We revisited the formula related to the overall tilt angle of a specimen using a side-entry double-tilt sample holder in a transmission electron microscope. Initially, we examined existing formulas in the literature for calculating the overall tilt angle. Subsequently, a new formula was derived, proven to better account for the actions of the double-tilt holder, thereby providing improved accuracy in the calculation. This newly derived formula has been implemented in the Landyne software suite. Furthermore, we demonstrated the accuracy of the new formula through examples. RESEARCH HIGHLIGHTS: A new formula has been derived to calculate overall tilt angles for side-entry double-tilt holders in TEM.
摘要：
我们在透射电子显微镜中使用侧入式双倾斜样品架重新研究了与样品整体倾斜角相关的公式。最初，我们研究了文献中用于计算总倾斜角的现有公式。随后，得出了一个新的公式，证明可以更好地说明双倾斜支架的动作，从而在计算中提供改进的准确性。这个新得出的公式已在Landyne软件套件中实现。此外，我们通过实例证明了新公式的准确性。研究重点：得出了一个新的公式来计算TEM中侧入式双倾斜支架的总倾斜角。
