关键词: Immediate dentin sealing Lithium disilicate Partial indirect restoration Posterior

来  源:   DOI:10.2186/jpr.JPR_D_23_00219

Abstract:
OBJECTIVE: This observational retrospective clinical study aimed to investigate the survival and success rates of partial indirect lithium disilicate restorations with margins extending above or beyond the cementoenamel junction (CEJ).
METHODS: The study included patients who underwent partial indirect lithium disilicate restorations with immediate dentin sealing (IDS) between January 2008 and October 2018. All the restorations were placed in a single general dental practice following a standardized protocol. The impact of various predictive variables on the survival rates was assessed. Moreover, modified United States Public Health Service (USPHS) criteria were used to evaluate the survival quality.
RESULTS: Totally 1146 partial indirect lithium disilicate restorations in 260 patients were evaluated over an average period of 7.5 years. The cumulative survival and success rates were 97.3% and 95.3%, respectively. Margins extending beyond the cemento-enamel junction did not increase the risk of success or survival failure (P > 0.05). Patients with a high risk of caries, male sex, or non-vital teeth had a significantly higher risk of restoration failure (P < 0.05). Restorations with longer clinical service times exhibited marginally lower clinical quality (P < 0.001).
CONCLUSIONS: Partial indirect glass-ceramic restorations demonstrated survival and success rates of 97.3% and 95.3%, respectively, over an extended period. However, a higher risk of restoration failure existed in patients with a high caries risk for (pre)molars that had undergone endodontic treatment and in males. In terms of the risk of success or survival failure, comparable results were obtained for the positions of the restoration margin in relation to the cemento-enamel junction.
摘要:
目的:这项观察性回顾性临床研究旨在调查边缘延伸至牙釉质交界处(CEJ)以上的部分间接二硅酸锂修复体的生存率和成功率。
方法:该研究包括在2008年1月至2018年10月期间接受部分间接二硅酸锂修复并立即进行牙本质密封(IDS)的患者。按照标准化方案,将所有修复体放置在一次常规牙科实践中。评估了各种预测变量对生存率的影响。此外,修改后的美国公共卫生服务(USPHS)标准用于评估生存质量。
结果:在平均7.5年的时间内,共评估了260例患者的1146种部分间接二硅酸锂修复体。累计生存率和成功率分别为97.3%和95.3%,分别。超出牙釉质-牙釉质交界处的边缘没有增加成功或存活失败的风险(P>0.05)。患龋齿风险高的患者,男性,无生命牙齿或无生命牙齿修复失败的风险显著增高(P<0.05)。临床服务时间较长的修复显示临床质量略低(P<0.001)。
结论:部分间接玻璃陶瓷修复体的存活率和成功率分别为97.3%和95.3%,分别,在很长一段时间内。然而,接受牙髓治疗的(前)磨牙龋齿风险高的患者和男性患者存在较高的修复失败风险.就成功或生存失败的风险而言,对于与牙釉质交界处相关的修复边缘位置,获得了可比的结果。
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