Abstract：
Filamentous fungi produce a wide range of relevant biotechnological compounds. The close relationship between fungal morphology and productivity has led to a variety of analytical methods to quantify their macromorphology. Nevertheless, only a µ-computed tomography (µ-CT) based method allows a detailed analysis of the 3D micromorphology of fungal pellets. However, the low sample throughput of a laboratory µ-CT limits the tracking of the micromorphological evolution of a statistically representative number of submerged cultivated fungal pellets over time. To meet this challenge, we applied synchrotron radiation-based X-ray microtomography at the Deutsches Elektronen-Synchrotron [German Electron Synchrotron Research Center], resulting in 19,940 3D analyzed individual fungal pellets that were obtained from 26 sampling points during a 48 h Aspergillus niger submerged batch cultivation. For each of the pellets, we were able to determine micromorphological properties such as number and density of spores, tips, branching points, and hyphae. The computed data allowed us to monitor the growth of submerged cultivated fungal pellets in highly resolved 3D for the first time. The generated morphological database from synchrotron measurements can be used to understand, describe, and model the growth of filamentous fungal cultivations.
摘要：
丝状真菌产生广泛的相关生物技术化合物。真菌形态与生产力之间的密切关系导致了多种分析方法来量化其宏观形态。然而，只有基于µ计算机断层扫描（µ-CT）的方法才能详细分析真菌颗粒的3D微观形态。然而,实验室µ-CT的低样品通量限制了对具有统计学代表性的浸没培养真菌颗粒的微观形态演变的跟踪。为了迎接这一挑战,我们在DeutschesElektronen-Synchtron[德国电子同步加速器研究中心]应用了基于同步加速器辐射的X射线显微断层扫描，在48小时黑曲霉浸没分批培养过程中，从26个采样点获得19,940个3D分析的单个真菌颗粒。对于每个颗粒，我们能够确定微观形态特性，如孢子的数量和密度，提示,分支点，和菌丝。计算数据使我们能够首次在高分辨率3D中监测浸没培养的真菌颗粒的生长。从同步加速器测量中生成的形态学数据库可用于理解，描述，并对丝状真菌培养物的生长进行建模。
