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Abstract：
Using a simulation protocol that mimics ultrafast scanning tunneling microscopy (STM) experiments, we demonstrate how pump-probe ultrafast STM may be used to image electron migration in molecules. Two pulses are applied to a model system, and the time-integrated current through the tip is calculated versus the delay time and tip position to generate STM images. With suitable pump and probe parameters, the images can track charge migration with atomistic spatial and femtosecond temporal resolutions.
摘要：
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